发明名称 Component geometry-independent device for testing electronic components with movable contact means
摘要 The invention relates to a device for testing electrical operability of electronic components (1) having different geometry, comprising an electrically conductive connecting element (3) which is connected in an electrically conductive manner to an electric testing device (4) for testing the electrical operability of electronic components(1) and which is connected or can be connected in an electrically conductive manner to contact means (5). The electronic component (1) to be tested can be advanced to the side of the contact means (5) opposite the connecting element (3) to bring about an electrically conductive contact, wherein the contact means (5) has a substantially strip-shaped structure, is at least somewhat elastic in the direction of contact perpendicular to the contact surface and electrically insulating in the direction of contact. The contact means (5) is at least somewhat moveable in the direction of the z and/or x and/or y axes.
申请公布号 AU5961500(A) 申请公布日期 2000.12.05
申请号 AU20000059615 申请日期 2000.05.16
申请人 DUAL-M-TECH AG 发明人 HANS-GEORG MEISSNER
分类号 G01R1/04;G01R1/073;G01R31/28 主分类号 G01R1/04
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