发明名称 METHOD AND APPARATUS FOR REDUCING PLASMA-INDUCED DAMAGE IN A SEMICONDUCTOR DEVICE
摘要 Some embodiments discussed relate to an apparatus for etching a semiconductor wafer and method for fabricating it, comprising a plurality of electrodes coupled to a power supply for generating a plasma stream and at least one electromagnetic radiation source and a wafer support to position a wafer for etching using the plasma stream and the wafer support having a plurality of apertures to allow passage of electromagnetic radiation from an electromagnetic radiation source through the wafer support to impinge on a surface of the wafer during etching.
申请公布号 US2008066866(A1) 申请公布日期 2008.03.20
申请号 US20060531959 申请日期 2006.09.14
申请人 KERBER MARTIN 发明人 KERBER MARTIN
分类号 C23F1/00 主分类号 C23F1/00
代理机构 代理人
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