| 摘要 |
FIELD: data processing.SUBSTANCE: invention can be used: for x-ray fluorescent determination of content of components in complex chemical composition materials. Present method comprises forming a single group of calibration samples covering entire range of content of determined and interfering elements for analysed samples, measuring intensity of analytical lines of only determined i (I) elements from analysed samples and calibration samples, establishing a calibration function in form of a regression equation, then, in order to compensate for unaccounted effect of undefined filler components on I, intensities registered from sample are compared with characteristics of one calibration sample-neighbour, and content of element i (C) is found using a certain expression by selecting composition of sample-neighbour closest to composition of sample.EFFECT: rapid analysis and removal of limitations on serial number of determined element.1 cl, 1 tbl, 4 dwg |
