发明名称 GLASS MASK AND MANUFACTURE OF SEMICONDUCTOR DEVICE BY USING THIS GLASS MASK
摘要 <p>PURPOSE:To enable the reduction of the width of a space constituting the patterns of a resist mask by using the glass mask which does not generate the mis-registration between reticules and the glass mask. CONSTITUTION:The glass mask formed with the 1st reticule and the 2nd reticule is mounted to an exposing device. A photoresist 40 is exposed by the 1st reticule 73. A semiconductor substrate 10 formed with the photoresist 40 is moved by using the X-Y stage of the exposing device and the photoresist 40 is exposed by the 2nd reticule. The photoresist 40 is thereafter developed, by which the resist mask 80 is formed.</p>
申请公布号 JPH05165195(A) 申请公布日期 1993.06.29
申请号 JP19910333571 申请日期 1991.12.17
申请人 TOSHIBA CORP;TOSHIBA MICRO ELECTRON KK 发明人 HOSOKAWA SHINICHIRO;YONEHARA KAZUO
分类号 G03F1/08;H01L21/027 主分类号 G03F1/08
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