发明名称 |
GLASS MASK AND MANUFACTURE OF SEMICONDUCTOR DEVICE BY USING THIS GLASS MASK |
摘要 |
<p>PURPOSE:To enable the reduction of the width of a space constituting the patterns of a resist mask by using the glass mask which does not generate the mis-registration between reticules and the glass mask. CONSTITUTION:The glass mask formed with the 1st reticule and the 2nd reticule is mounted to an exposing device. A photoresist 40 is exposed by the 1st reticule 73. A semiconductor substrate 10 formed with the photoresist 40 is moved by using the X-Y stage of the exposing device and the photoresist 40 is exposed by the 2nd reticule. The photoresist 40 is thereafter developed, by which the resist mask 80 is formed.</p> |
申请公布号 |
JPH05165195(A) |
申请公布日期 |
1993.06.29 |
申请号 |
JP19910333571 |
申请日期 |
1991.12.17 |
申请人 |
TOSHIBA CORP;TOSHIBA MICRO ELECTRON KK |
发明人 |
HOSOKAWA SHINICHIRO;YONEHARA KAZUO |
分类号 |
G03F1/08;H01L21/027 |
主分类号 |
G03F1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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