发明名称 |
Integrated circuit tester socket |
摘要 |
In order to construct an IC-tester socket as a whole into a compact size and to make the mounting and removal of an IC package easy and further to enable stable and positive contact between the lead terminals of the IC package and contact pins, the IC-tester socket is comprised of a socket body capable of accomodating an IC package; a plurality of contact pins provided within the socket body and each having resilient first and second arms capable, in their normal state, of nipping each said lead terminal; and releasers mounted vertically movably on the socket body for being able to release the nipping of the lead terminals done by these first and second arms.
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申请公布号 |
US4691975(A) |
申请公布日期 |
1987.09.08 |
申请号 |
US19860921255 |
申请日期 |
1986.10.21 |
申请人 |
DAI-ICHI SEIKO CO LTD |
发明人 |
FUKUNAGA, MASAMI;YAMAGUCHI, TOMOYOSHI |
分类号 |
H01L23/32;H01R33/76;H05K7/10;(IPC1-7):H01R13/635 |
主分类号 |
H01L23/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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