发明名称 METHOD AND SYSTEM FOR MEASURING PARTICLE GEOMETRY
摘要 <p>A system for measuring geometric properties of a single particle (40) using an optical method. The particle (40) is in a sample in a zone (42) of processing. Light source (50) projects a beam (52) through a deflecting prism (54) to illuminate the particle (40). The light source (50) can be a laser. The particle (40) is in a volume formed by an axis of a plano-convex lens (56) and the light beam (52) so that the backscatted light (58) passes through the lens (56), a polarizer (60) behind the lens (56), a second lens (64), a pinhole (66) and finally a detector (70). The detector sends the signal to an image processing unit (72), a DSP (74) and a display screen (76). The geometric properties detected can be diameter, shape and surface roughness.</p>
申请公布号 WO1997034139(A1) 申请公布日期 1997.09.18
申请号 US1997003567 申请日期 1997.03.11
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