发明名称 POLISHING COMPACT AND POLISHING SURFACE PLATE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a polishing compact which can be used in a machining process or a CMP-process for polishing a base material such as a semiconductor substrate, an oxide substrate or a glass substrate or a soft material such as an optical material needing precision processing, and with which the problem related to a waste liquid can be almost solved, a material to be polished is efficiently polished with the finishing equivalent to or better than that attained by a method using a conventional polishing cloth and the formation of polishing cracks can be inhibited, and to provide a polishing surface plate using the polishing compact. SOLUTION: The polishing compact contains inorganic materials, each having hardness of 50 to 400 kg/mm2, in the total amount of >=90 wt.%, has a relative density of 20 to 70% and is composed of particles having an average particle size of 0.001 to 50 μm. The polishing surface plate is obtained by attaching necessary parts to the polishing compact.
申请公布号 JP2001348271(A) 申请公布日期 2001.12.18
申请号 JP20000169056 申请日期 2000.06.01
申请人 TOSOH CORP 发明人 KURAMOCHI TOSHIHITO;KONDO SATORU;HARADA YOSHINORI;ASANO MUTSUMI
分类号 B24B37/00;B24D3/00;B24D3/34;B24D11/00;C04B35/46 主分类号 B24B37/00
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