发明名称 SEMICONDUCTOR MANUFACTURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a product, which uses a high frequency plasma process wherein a stray or parasitic capacitance coupling is not substantially formed between a plasma source and portions (such as a substrate and wall) of a process chamber having a ground potential or a potential around the ground potential. Ž<P>SOLUTION: The method for manufacturing the product consists of steps of: subjecting a substrate to treatment with a composition of substances; and using the treated substrate so as to finish the product. At least one of the substances is produced from a species generated by a gaseous discharge excited by a helical resonator equipped with a coil. An integrated current supplied by the capacity coupling of plasma into a coil component having a larger potential than a surrounding shield potential is substantially equal to an integrated current supplied by the capacity coupling of plasma into other coil elements having a smaller potential than a surrounding shield potential. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010021590(A) 申请公布日期 2010.01.28
申请号 JP20090246591 申请日期 2009.10.27
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 VINOGRADOV GEORGY;YONEYAMA SHIMAO
分类号 H01L21/3065;C23C16/50;C23C16/505;H01J37/32;H01L21/205;H01L21/302;H05H1/46 主分类号 H01L21/3065
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