发明名称 Full-field maskless lithography projection optics
摘要 Projection optics for a lithographic projection system is provided that comprises a spatial light modulator (SLM) from which radiation is reflected and directed to a projection lens that projects the radiation to a substrate. The SLM is illuminated by non telecentric off axis illumination (e.g. from laser radiation that has a spectral bandwidth of the order of 1 picometer, and the projection optics is configured for significant reduction (e.g. at least 10× reduction, 20× reduction, or 50× reduction).
申请公布号 US9411246(B2) 申请公布日期 2016.08.09
申请号 US201213538287 申请日期 2012.06.29
申请人 Nikon Corporation 发明人 Williamson David Michael
分类号 G02F1/29;G03F7/20 主分类号 G02F1/29
代理机构 Quarles & Brady, LLP 代理人 Sidorin Yakov;Quarles & Brady, LLP
主权项 1. A projection optics for a lithographic projection system, comprising: a catadioptric projection lens with at least one concave mirror, and optical elements between an image plane and the at least one concave mirror, wherein the projection optics is an object-side non-telecentric optical system, configured to provide an image reduction by at least a factor of 10 and to satisfy the following condition: 4<R.sub.m/[2*Half Field]<7, wherein R.sub.m is a radius of the concave mirror, and Half Field is the half field height of the image field.
地址 Tokyo JP