发明名称 PHOTOGRAMMETRY SYSTEM AND PHOTOGRAMMETRY METHOD
摘要 The present invention relates to a photogrammetry system and method. The photogrammetry system comprises: photographing devices capable of photographing an object at a predetermined time interval; and, a data processing device capable of calculating an actual length of the object or a certain portion on the object according to a length of the object or a certain portion on the object in the images obtained by the photographing devices and a distance of the object in the two images, wherein the object moves at a speed V; the photographing devices photograph the object for two times at a time interval t; the distance of the object in the two images obtained by the two times of photographing is Dp; the length of the object or a certain portion on the object in the images is Lp; and, the actual length L of the object or a certain portion on the object may be obtained by the following formula:;L=Lp×VtDp.
申请公布号 US2016253822(A1) 申请公布日期 2016.09.01
申请号 US201514981947 申请日期 2015.12.29
申请人 NUCTECH COMPANY LIMITED 发明人 LI Mingliang;LI Yuanjing;Li Jianmin;LI Ying;CHEN Zhiqiang;KANG Kejun
分类号 G06T7/20;H04N5/247 主分类号 G06T7/20
代理机构 代理人
主权项 1. A photogrammetry system, comprising: photographing devices in a direction substantially vertical to a direction of movement of an object to be measured with respect to the photographing devices, the photographing devices being able to photograph the object to be measured for at least two times at a predetermined time interval to obtain at least two images, respectively; and a data processing device, which calculates, according to a length of the object to be measured or at least one portion of the object to be measured in the images obtained by the photographing devices, a transverse movement distance of the object to be measured or the at least one portion of the object to be measured in the two images and a speed of the object to be measured, an actual length of the object to be measured or the at least one portion of the object to be measured.
地址 Beijing CN