发明名称 Method and System for Determining 3D Object Poses and Landmark Points using Surface Patches
摘要 A method and system determine a three-dimensional (3D) pose of an object and 3D locations of landmark points of the object by first obtaining a 3D point cloud of the object. 3D surface patches are extracted from the 3D point cloud, and a parametric model is fitted to each 3D surface patch to determine a set of descriptors. A set of correspondences between the set of descriptors and a set of descriptors of patches extracted from 3D point clouds of objects from the same object class with known 3D poses and known 3D locations of landmark points is determined. Then, the 3D pose of the object and 3D locations of the landmark points of the object are estimated from the set of correspondences.
申请公布号 US2016253807(A1) 申请公布日期 2016.09.01
申请号 US201514632466 申请日期 2015.02.26
申请人 Mitsubishi Electric Research Laboratories, Inc. 发明人 Jones Michael J.;Marks Tim;Papazov Chavdar
分类号 G06T7/00;G06K9/46;G06K9/00;G06T5/10 主分类号 G06T7/00
代理机构 代理人
主权项 1. A method for determining a three-dimensional (3D) pose of an object and 3D locations of landmark points of the object, comprising steps of: obtaining a 3D point cloud of the object; extracting 3D surface patches from the 3D point cloud; fitting a parametric model to each 3D surface patch to determine a set of descriptors; determining a set of correspondences between the set of descriptors and a set of descriptors of patches extracted from 3D point clouds of objects from the same object class with known 3D poses and known 3D locations of landmark points; and estimating the 3D pose of the object and 3D locations of the landmark points of the object from the set of correspondences, wherein the steps are performed in a processor connected to a memory storing the 3D point cloud.
地址 Cambridge MA US