发明名称 MULTIPLE ENERGY X-RAY MEASURING APPARATUS
摘要 PURPOSE:To measure an object to be inspected in motion, by arranging one or more of spectral elements on an X-ray optical axis and making an incident angle independently variable. CONSTITUTION:X-rays emitted from an X-ray source 1 are allowed to be incident to an object 2 to be inspected and the transmitted X-rays are allowed to be incident to the first spectroscope 3 to selectively reflect only a component having the wavelength lambda1 corresponding to an incident angle theta1 and said component is measured by a two-dimensional X-ray detector 4. When the spectroscope 3 is sufficiently thin, a component having a wavelength different from the wavelength lambda1 transmits through the spectroscope 3 to be incident to the second spectroscope 5 and only a component having the wavelength lambda2 corresponding to an incident angle theta2 is reflected to be measured by a two-dimensional X-ray detector 6. As mentioned above, by arranging the spectroscopes 3, 5 at different incident angles, transmitted images due to monochromatic X-rays of two kinds of energies can be simultaneously measured. By this method, an object to be inspected in motion can be measured.
申请公布号 JPS63106547(A) 申请公布日期 1988.05.11
申请号 JP19860251639 申请日期 1986.10.24
申请人 HITACHI LTD 发明人 SUZUKI YOSHIO;KONO HIDEKI
分类号 G01N23/02;A61B6/00;G01N23/04;G21K1/06 主分类号 G01N23/02
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