发明名称 SCANNING CIRCUIT
摘要 PROBLEM TO BE SOLVED: To eliminate wrong operations of signals and phase shifts of scanning pulses between chips even when plural IC chips of high-speed bilateral scanning circuits for driving liquid crystal displays are connected. SOLUTION: A right shift input circuit 103 and a left shift output circuit 105 are installed between the series connecting points N2, N4 of the transfer gates, 109-1 to 125, connected in series and a first I/O terminal 101. A right shift output circuit 106 and a left shift input circuit 104 are installed between series connecting points N122, N124 and a second I/O terminal 102. By this, the effects of stray capacitance 114 added to the two terminals 107, 108 of the series connecting group of the transfer gate are eliminated and no wrong operation of signals is caused. And by connecting the input/output terminals to the input/output terminals of other IC chips respectively, high-speed bilateral scanning circuit based on the cascade connection of plural IC chips is obtained without phase displacement of scanning pulses between chips.
申请公布号 JPH10161594(A) 申请公布日期 1998.06.19
申请号 JP19960315763 申请日期 1996.11.27
申请人 NEC CORP 发明人 ASADA HIDEKI
分类号 G02F1/133;G09G3/20;G09G3/36;G11C19/28;H04N5/66 主分类号 G02F1/133
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