发明名称 Lithographic projection apparatus and device manufacturing method
摘要 A lithographic apparatus of the scanning type in which reticle masking blades 7 are opened at the beginning of a scan. Means are provided to compensate for an increase in the intensity density of the illumination beam as the reticle masking blades are opened. These means may comprise lamp control means 10 for controlling a compensating decrease in the lamp intensity. The reticle masking blades 70 may be manufactured of, e.g., quartz and provided with a reflective rear coating, e.g. of aluminium, so that portions of the illumination beam intercepted by the reticle masking blades are totally internally reflected. <IMAGE>
申请公布号 EP0950924(A2) 申请公布日期 1999.10.20
申请号 EP19990302740 申请日期 1999.04.08
申请人 ASM LITHOGRAPHY B.V. 发明人 VAN DER LEI, SIJBE ABRAHAM HARTMAN;DE LEEUW, RARD WILLEM;BONNEMA, GERRIT MAARTEN;CORBEIJ, WILHELMUS MARIA
分类号 G03F7/20;(IPC1-7):G03F7/20 主分类号 G03F7/20
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