发明名称 CHARGED PARTICLE BEAM APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam apparatus having a high image noise removing effect. SOLUTION: For the charged particle beam apparatus which performs observation, recording and analysis of an image from a scanning microscope, a digital space-time filter arithmetic circuit 17 for processing detected signals is provided in an image signal system.
申请公布号 JP2002015693(A) 申请公布日期 2002.01.18
申请号 JP20000198065 申请日期 2000.06.30
申请人 JEOL LTD 发明人 YAMADA MITSUGI
分类号 G06T5/00;G06T5/20;H01J37/22;H01J37/28;(IPC1-7):H01J37/22 主分类号 G06T5/00
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