发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, CIRCUIT BOARD, AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device capable of improving an etching rate in dry etching and improving the quality of the semiconductor device. SOLUTION: Before carrying out dry-etching to the rear face of a semiconductor substrate 10, a film 70 reduced in the area of an etching opening is formed on the rear face 10b of the semiconductor substrate 10. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005210048(A) 申请公布日期 2005.08.04
申请号 JP20040112063 申请日期 2004.04.06
申请人 SEIKO EPSON CORP 发明人 MATSUO TAKEHIDE
分类号 H01L23/52;H01L21/3205;H01L25/065;H01L25/07;H01L25/18;(IPC1-7):H01L21/320 主分类号 H01L23/52
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