发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, CIRCUIT BOARD, AND ELECTRONIC APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device capable of improving an etching rate in dry etching and improving the quality of the semiconductor device. SOLUTION: Before carrying out dry-etching to the rear face of a semiconductor substrate 10, a film 70 reduced in the area of an etching opening is formed on the rear face 10b of the semiconductor substrate 10. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005210048(A) |
申请公布日期 |
2005.08.04 |
申请号 |
JP20040112063 |
申请日期 |
2004.04.06 |
申请人 |
SEIKO EPSON CORP |
发明人 |
MATSUO TAKEHIDE |
分类号 |
H01L23/52;H01L21/3205;H01L25/065;H01L25/07;H01L25/18;(IPC1-7):H01L21/320 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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