发明名称 |
METHOD FOR FORMING ISOLATION LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
A method for forming an isolation layer in a semiconductor device is provided to prevent the area of an active region from being decreased by growing an epitaxial layer in a trench where an isolation layer is to be formed. From a semiconductor substrate(31) having an active region and an isolation region, the isolation region is etched to form a trench(T). A heat treatment is performed on the resultant structure to decrease etch damage generated in an etch process for forming the trench. The heat-treated oxide layer is removed. A silicon epitaxial layer is grown on the surface of the trench. A sidewall oxide layer(34) is formed on the surface of the trench having the silicon epitaxial layer. An insulation layer(36) is filled in the trench having the sidewall oxide layer.
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申请公布号 |
KR20080011619(A) |
申请公布日期 |
2008.02.05 |
申请号 |
KR20060072415 |
申请日期 |
2006.07.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
SONG, SEOK PYO;SHEEN, DONG SUN;AHN, SANG TAE;AN, HYEON JU |
分类号 |
H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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