发明名称 METHOD FOR FORMING ISOLATION LAYER OF SEMICONDUCTOR DEVICE
摘要 A method for forming an isolation layer in a semiconductor device is provided to prevent the area of an active region from being decreased by growing an epitaxial layer in a trench where an isolation layer is to be formed. From a semiconductor substrate(31) having an active region and an isolation region, the isolation region is etched to form a trench(T). A heat treatment is performed on the resultant structure to decrease etch damage generated in an etch process for forming the trench. The heat-treated oxide layer is removed. A silicon epitaxial layer is grown on the surface of the trench. A sidewall oxide layer(34) is formed on the surface of the trench having the silicon epitaxial layer. An insulation layer(36) is filled in the trench having the sidewall oxide layer.
申请公布号 KR20080011619(A) 申请公布日期 2008.02.05
申请号 KR20060072415 申请日期 2006.07.31
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SONG, SEOK PYO;SHEEN, DONG SUN;AHN, SANG TAE;AN, HYEON JU
分类号 H01L21/76 主分类号 H01L21/76
代理机构 代理人
主权项
地址