发明名称 Line driver circuit for a semiconductor memory device
摘要 A semiconductor memory device having a word line driver circuit configured in stages. A plurality of sub word line driver circuits are connected, in parallel, to each main word line, and provide a sub word line enable signal to a selected sub word line in response to a main word line enable signal provided through a main word line. A plurality of (local) word line driver circuits are connected in parallel, to each sub word line and provide a local word line enable signal to a selected local word line in response to the (main/sub) word line enable signal so as to operate a plurality of memory cells connected to the selected local word line. The transistor count and layout area of a semiconductor memory device decreases and a reduced chip area can be achieved.
申请公布号 US7345945(B2) 申请公布日期 2008.03.18
申请号 US20050232170 申请日期 2005.09.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON BYUNG-GIL;MIN BYUNG-JUN;LEE KANG-WOON;LEE HAN-JOO
分类号 G11C8/00 主分类号 G11C8/00
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