发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A transistor excellent in electrical characteristics and a method for manufacturing the transistor are provided. The transistor includes an oxide semiconductor layer including a source region, a drain region, and a channel formation region over an insulating surface; a gate insulating film over the oxide semiconductor layer; a gate electrode overlapping with the channel formation region, over the gate insulating film; a source electrode in contact with the source region; and a drain electrode in contact with the drain region. The source region and the drain region include a portion having higher oxygen concentration than the channel formation region.
申请公布号 US2016163880(A1) 申请公布日期 2016.06.09
申请号 US201615045298 申请日期 2016.02.17
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 OHNO Shinji;WATANABE Hirokazu;KUSUMOTO Naoto
分类号 H01L29/786;H01L21/425;H01L29/24 主分类号 H01L29/786
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor device, comprising the steps of: forming an oxide semiconductor layer over an insulating surface; forming a gate insulating film over the oxide semiconductor layer; forming a gate electrode over the gate insulating film so as to overlap with the oxide semiconductor layer; and adding oxygen to a region which is in the oxide semiconductor layer and does not overlap with the gate electrode.
地址 Atsugi-shi JP