发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
A transistor excellent in electrical characteristics and a method for manufacturing the transistor are provided. The transistor includes an oxide semiconductor layer including a source region, a drain region, and a channel formation region over an insulating surface; a gate insulating film over the oxide semiconductor layer; a gate electrode overlapping with the channel formation region, over the gate insulating film; a source electrode in contact with the source region; and a drain electrode in contact with the drain region. The source region and the drain region include a portion having higher oxygen concentration than the channel formation region. |
申请公布号 |
US2016163880(A1) |
申请公布日期 |
2016.06.09 |
申请号 |
US201615045298 |
申请日期 |
2016.02.17 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
OHNO Shinji;WATANABE Hirokazu;KUSUMOTO Naoto |
分类号 |
H01L29/786;H01L21/425;H01L29/24 |
主分类号 |
H01L29/786 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method for manufacturing a semiconductor device, comprising the steps of:
forming an oxide semiconductor layer over an insulating surface; forming a gate insulating film over the oxide semiconductor layer; forming a gate electrode over the gate insulating film so as to overlap with the oxide semiconductor layer; and adding oxygen to a region which is in the oxide semiconductor layer and does not overlap with the gate electrode. |
地址 |
Atsugi-shi JP |