发明名称 SILICON CARBIDE SEMICONDUCTOR SUBSTRATE, METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR SUBSTRATE, AND METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE
摘要 A silicon carbide semiconductor substrate includes: a base substrate that has a main surface having an outer diameter of not less than 100 mm and that is made of single-crystal silicon carbide; an epitaxial layer formed on the main surface; and a deformation suppression layer formed on a backside surface of the base substrate opposite to the main surface. In this way, the deformation suppression layer suppresses the substrate from being deformed (for example, warped during high-temperature treatment). This can reduce a risk of causing defects such as crack in the silicon carbide semiconductor substrate during the manufacturing process in performing a method for manufacturing a silicon carbide semiconductor device using the silicon carbide semiconductor substrate.
申请公布号 US2016163545(A1) 申请公布日期 2016.06.09
申请号 US201414910169 申请日期 2014.06.25
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 Horii Taku;Masuda Takeyoshi
分类号 H01L21/02;H01L29/16 主分类号 H01L21/02
代理机构 代理人
主权项 1. A silicon carbide semiconductor substrate comprising: a base substrate that has a main surface having an outer diameter of not less than 100 mm and that is made of single-crystal silicon carbide; an epitaxial layer formed on said main surface; and a deformation suppression layer formed on a backside surface of said base substrate opposite to said main surface.
地址 Osaka JP