发明名称 DATA QUALITY MEASUREMENT METHOD AND SYSTEM BASED ON A QUARTILE GRAPH
摘要 The present invention provides a data quality measurement method based on a quartile graph, the method comprising: defining a data grid (Gx) and fitting a plurality of trend lines; scanning a data source and storing, and according to actual trends of the data, selecting a trend line and displaying data; generating data quality rules according to the determined trend line type and parameters; selecting appropriate data quality rules and measuring data quality according to a threshold. By means of defining a data grid (Gx) to store data, using a quartile graph to display data, and generating data quality rules according to the determined trend line type and parameters, and further setting a threshold according to said rules and measuring data quality, the present invention performs, for enormous amounts of data, applications such as display of data, analysis of abnormal data, and data error correction. In addition, another embodiments of the present invention provides a data quality measurement system based on a quartile graph.
申请公布号 US2016196311(A1) 申请公布日期 2016.07.07
申请号 US201414655270 申请日期 2014.08.18
申请人 SHENZHEN AUDAQUE DATA TECHNOLOGY LTD 发明人 Wang Mingxing;Fan Wenfei;Jia Xibei
分类号 G06F17/30 主分类号 G06F17/30
代理机构 代理人
主权项 1. A data quality measurement method based on a quartile graph, comprising: defining a data grid (Gx) and fitting a plurality of trend lines; scanning a data source and storing, and according to actual trends of the data, selecting a trend line and displaying data; generating data quality rules according to the determined trend line type and parameters; selecting appropriate data quality rules and measuring data quality according to a threshold, wherein, both selection of the trend line and display of the data are performed on a quartile graph, wherein the data grid (Gx) is defined before scanning the data source and wherein said scanning a data source and storing comprises: scanning the data source, reading every recorded values of X and Y: x and y;according to the display scale of the X axis, calculating the data grid (Gx) corresponding to x and y, and storing the corresponding data into Gx.
地址 Middle Nanshan District Shenzhen CN