发明名称 SEMICONDUCTOR TESTING DEVICE
摘要 PURPOSE:To improve testing efficiency by changing easily the test sequence meeting various kinds of devices to be tested. CONSTITUTION:The device 1 to be tested is tested by a testing device A. This device A has an I/O port 2 exchanging of data between the port and a measuring instrument 9 for testing said device and an arithmetic control part 3 to be connected the port. A data memory 7-1, an interpreting and execution memory 7-2 and a test program composing device 8 are connected to the control part 3. The device 1 is tested in accordance with the test program formed by the device 8 using the data of the data memory 7-1. The data obtd. from the device 1 is tested and is read through the instrument 9 and the I/O port 2 into the control part 3. The test value and standard value are compared and are discriminated of whether the result is acceptable or rejective by the part 3.
申请公布号 JPS61173176(A) 申请公布日期 1986.08.04
申请号 JP19850013629 申请日期 1985.01.29
申请人 OKI ELECTRIC IND CO LTD 发明人 ONO MASASHI;HIRAKAWA SHIGEKI
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址
您可能感兴趣的专利