发明名称 LAYER THICKNESS MEASUREMENT OF LIQUID CRYSTAL ANCHORING LAYER
摘要 PURPOSE:To measure the film thickness of a liquid crystal anchoring layer handily and at a low cost by utilizing the relationship between rotatory power obtained, by measurement and the thickness of liquid crystal and rotatory power of liquid crystal. CONSTITUTION:The height l of spacers 4a and 4b is set in plurality l1-l5 and a plurality of liquid crystal cells having gaps according to respective heights are prepared. Then, normal light is projected into respective liquid crystal cells and a rotatory power meter is used to measure the rotatory power from the incident light L1 and emission light L2. As a result, the relationship between the cell gaps 4l1-l5 and the rotatory power is obtained. The relationship is expressed in the X-Y coordinates (X axis: cell gap and Y axis: rotatory power). Then the cell gap is read out at a point where a straight light connecting dots intersects the X axis, namely, a point where the rotatory power is zero. This value gives the thickness of the anchoring layer.
申请公布号 JPS62169007(A) 申请公布日期 1987.07.25
申请号 JP19860011251 申请日期 1986.01.22
申请人 FUJITSU LTD 发明人 MOCHIZUKI AKIHIRO;YOSHIHARA TOSHIAKI;IWASAKI MASAYUKI;ONDA FUMIYO;YAMAGISHI YASUO
分类号 G01B11/06 主分类号 G01B11/06
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