发明名称 SURFACE FLAW INSPECTING DEVICE
摘要 PURPOSE:To inspect a surface to be inspected for flaws over a wide extent with a fiber bundle composed of a small number of optical fibers and, at the same time, to reduce the size and weight of a light receiving system. CONSTITUTION:This surface flaw inspecting device is constituted of a light transmitting system composed of a condenser lens 3 which scans a surface 6 to be inspected with laser light 2 converted to a narrow beam in one direction and vibratory mirror 5, light receiving system composed of a light receiving lens 5 which receives scattered light 8 reflected by the surface 6 and a fiber bundle 11, and photoelectric converter 12 and signal processor 13 which analyze the presence/absence of a surface flaw by processing the light receiving signal of the light receiving system. The fiber bundle 11 is set to a position 10' which is deviated from the image forming position 10 of the lens 9.
申请公布号 JPH0587743(A) 申请公布日期 1993.04.06
申请号 JP19910273230 申请日期 1991.09.25
申请人 MITSUBISHI HEAVY IND LTD 发明人 NODA SHOHEI;ETSU MIYUKI;HORI JUNICHIRO;TERADA MASABUMI;KAWAHARA KENICHI
分类号 G01B11/30;G01N21/88;G03F1/84;G06T1/00;H04N7/18 主分类号 G01B11/30
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