发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a compact, safe semiconductor device with a high breakdown voltage. SOLUTION: A semiconductor device 1 is provided with an envelope 2 that is in a bookcase type with a side surface opening 12 on one side surface of a flat box and has a bottom opening 10 on the other side surface that does not face the one side surface and a heat radiation surface 13 that is exposed from the bottom surface opening 12. Also, the semiconductor device 1 is provided with a metal base 5 for sealing the bottom surface opening 12, an insulation substrate 6 that is fixed on the reverse side of the heat radiation surface 13, a power semiconductor element 7 that is fixed on the insulation substrate 6, circuit wiring 8 that is fixed on the insulation substrate 6, an external terminal 4 that is led from at least one side surface of the envelope 2 to the outside of the envelope 2, a lid body 3 for closing the side surface opening 10, and an insulation resin 9 that is filled into the envelope 2 for sealing the metal base 5, the insulation substrate 6, the power semiconductor element 7, and the circuit wiring 8.
申请公布号 JP2000183277(A) 申请公布日期 2000.06.30
申请号 JP19980359665 申请日期 1998.12.17
申请人 TOSHIBA CORP 发明人 SEKIYA HIRONORI;HIRAMOTO HIROYUKI;SHIMIZU TOSHIO;KIJIMA KENJI
分类号 H01L25/07;H01L25/18;(IPC1-7):H01L25/07 主分类号 H01L25/07
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