发明名称 LATERAL MOS FIELD EFFECT TRANSISTOR HAVING DRAIN DOPED TO LOW CONCENTRATION, AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To decrease concentration to the gate of an isoelectric wire, and to increase the breakdown voltage in a DMOS transistor. SOLUTION: The lateral double diffusion MOS transistor is to have a diode structure. The diode structure has an oxidation layer that has a first conductivity-type layer and an epitaxial layer formed on an embedded layer, exposes first and second regions of the epitaxial layer, and is formed on the surface of the epitaxial layer, a second conductivity-type drift region that is formed on the first region adjacent to the oxidation layer, a second conductivity- type cathode region that is adjacent to the drift region, and a first conductivity- type cathode region that is formed in the second region adjacent to the oxidation layer.
申请公布号 JP2002261297(A) 申请公布日期 2002.09.13
申请号 JP20020008981 申请日期 2002.01.17
申请人 SILICONIX INC 发明人 WILLIAMS RICHARD K;CORNELL MICHAEL E
分类号 H01L21/329;H01L21/336;H01L21/8238;H01L27/092;H01L29/06;H01L29/10;H01L29/40;H01L29/78;H01L29/861 主分类号 H01L21/329
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