发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which suppresses the growth of pores in a crystalline silicon film formed by crystallizing with an element for accelerating the crystallization and then gettering to decrease the concentration of the element in the crystalline silicon film. SOLUTION: For removing a silicon oxide film formed on a silicon film, an etchant is used which is a liquid containing fluoride and a substance revealing a surface activity. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005210104(A) |
申请公布日期 |
2005.08.04 |
申请号 |
JP20040372852 |
申请日期 |
2004.12.24 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ONUMA HIDETO;INOUE KOKI |
分类号 |
H01L21/20;H01L21/322;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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