发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which suppresses the growth of pores in a crystalline silicon film formed by crystallizing with an element for accelerating the crystallization and then gettering to decrease the concentration of the element in the crystalline silicon film. SOLUTION: For removing a silicon oxide film formed on a silicon film, an etchant is used which is a liquid containing fluoride and a substance revealing a surface activity. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005210104(A) 申请公布日期 2005.08.04
申请号 JP20040372852 申请日期 2004.12.24
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ONUMA HIDETO;INOUE KOKI
分类号 H01L21/20;H01L21/322;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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