发明名称 Method of manufacturing semiconductor device
摘要 According to the present invention, an impurity region, to which a rare gas element (also called a rare gas) and one kind or a plurality of kinds of elements selected from the group consisting of H, H<SUB>2</SUB>, O, O<SUB>2</SUB>, and P are added, are formed in a semiconductor film having a crystalline structure, using a mask, and gettering for segregating a metal element contained in the semiconductor film to the impurity region by heat treatment. Thereafter, pattering is conducted using the mask, whereby a semiconductor layer made of the semiconductor film having a crystalline structure is formed.
申请公布号 US7033871(B2) 申请公布日期 2006.04.25
申请号 US20050061780 申请日期 2005.02.22
申请人 发明人
分类号 H01L21/00;H01L21/20;H01L21/322;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786 主分类号 H01L21/00
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