发明名称 SUBSTRATE PROCESSING APPARATUS, METHOD FOR MODIFYING SUBSTRATE PROCESSING CONDITIONS AND STORAGE MEDIUM
摘要 A substrate processing apparatus, a method for modifying substrate processing conditions and a storage medium are provided to modify the processing conditions for the substrate whose process has been stopped, thereby performing a process on a substrate again whose process has been stopped in an optimal manner. A setting unit sets substrate processing conditions for a substrate(W) in a substrate processing unit processing the substrate. A detection unit detects an abnormality of the substrate processing unit while the substrate processing unit processes the substrate under the substrate processing conditions. A stopping unit stops the process of the substrate processing unit if the abnormality is detected. A modifying unit modifies the substrate processing conditions for a substrate on which the process is stopped by the stopping unit. The modifying unit modifies the substrate processing conditions by revising the substrate processing conditions.
申请公布号 KR20070089604(A) 申请公布日期 2007.08.31
申请号 KR20070018840 申请日期 2007.02.26
申请人 TOKYO ELECTRON LIMITED 发明人 YOKOUCHI TAKESHI;YAGI FUMIKO
分类号 H01L21/02;H01L21/306 主分类号 H01L21/02
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