发明名称 |
CMOS IMAGE SENSOR INCLUDING A FLOATING DIFFUSION REGION INCLUDING A PLURALITY OF IMPURITY DOPED REGIONS |
摘要 |
A CMOS(complementary metal oxide semiconductor) image sensor including a floating diffusion region having a plurality of impurity doping regions is provided to reduce dark current by varying the doping profile of a floating diffusion region. A photoelectric generation part(210) is formed in a substrate. A floating diffusion region includes a plurality of isolation regions(310) in the substrate and a first impurity doping region formed among the plurality of isolation regions wherein the first impurity doping region is separated from the lateral surface of the isolation region by a predetermined interval. The electrons generated from the photoelectric generation part are transferred to the floating diffusion region by a transfer part(220). An upper impurity doping region can be formed between the surface of the substrate and the first impurity doping region.
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申请公布号 |
KR20070116565(A) |
申请公布日期 |
2007.12.10 |
申请号 |
KR20070055231 |
申请日期 |
2007.06.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, JUNG HO;OH, TAE SEOK |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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