发明名称 CMOS IMAGE SENSOR INCLUDING A FLOATING DIFFUSION REGION INCLUDING A PLURALITY OF IMPURITY DOPED REGIONS
摘要 A CMOS(complementary metal oxide semiconductor) image sensor including a floating diffusion region having a plurality of impurity doping regions is provided to reduce dark current by varying the doping profile of a floating diffusion region. A photoelectric generation part(210) is formed in a substrate. A floating diffusion region includes a plurality of isolation regions(310) in the substrate and a first impurity doping region formed among the plurality of isolation regions wherein the first impurity doping region is separated from the lateral surface of the isolation region by a predetermined interval. The electrons generated from the photoelectric generation part are transferred to the floating diffusion region by a transfer part(220). An upper impurity doping region can be formed between the surface of the substrate and the first impurity doping region.
申请公布号 KR20070116565(A) 申请公布日期 2007.12.10
申请号 KR20070055231 申请日期 2007.06.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JUNG HO;OH, TAE SEOK
分类号 H01L27/146 主分类号 H01L27/146
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