| 摘要 |
A loading system for test handler is provided to improve a losing speed without using a starting type loading table by minimizing an operational overlapping effect between two pick and place devices. A loading system(600) for test handler is positioned and fixed between a customer tray and a carrier board in a loading position. The loading system includes a first pick and place unit(620), a second pick and place unit(630), and a control unit(640). The first pick and place unit grips a semiconductor device from a customer tray and transfers the semiconductor device to a next alignment block(610). The first pick and place unit loads the semiconductor device into an alignment block. The second pick and place unit grips the semiconductor device from the alignment block and transfers the semiconductor device to a carrier board. The second pick and place unit loads the semiconductor device into the carrier board. The control unit controls operations of the first and second pick and place units. |
