发明名称 X-ray analyzer using electron beam
摘要 An electron probe X-ray analyzer capable of automatically setting appropriate analytical conditions if there are unknown compounds by performing analysis under the analytical conditions adapted for analysis points having different compositions in a case where the numerous analysis points having the plural compositions are analyzed by WDS (wavelength-dispersive X-ray spectrometer). At each analysis point, the analyzer performs quantitative analysis using EDS (energy-dispersive X-ray spectrometer) permitting easy and quick analysis. Based on the results, chemical compounds are identified. If the results indicate that there is any new compound, analytical conditions adapted for the new compound are selected. If the new compound is already registered in a database, the analytical conditions are read from the database. Then, quantitative analysis is performed using WDS.
申请公布号 US7592591(B2) 申请公布日期 2009.09.22
申请号 US20070784686 申请日期 2007.04.09
申请人 JEOL LTD. 发明人 NOTOYA SATOSHI
分类号 H01J37/26 主分类号 H01J37/26
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