METHOD AND APPARATUS FOR THE MICRO-ANALYSIS OR IMAGING OF SAMPLES
摘要
Apparatus for the micro-analysis or imaging of a sample comprises: (a) an arrangement for producing a scanning micro-focussed neutral atom beam said arrangement itself comprising; (i) means (1) for generating an ion beam, (ii) means (4) for for scanning the ion beam, (iii) means (5) for focussing the ion beam towards the position at which the sample (8) will be located; and (iv) charge exchange means (6) between the focussing means and the sample position whereby a scanning neutral beam focussing on the sample is produced; and (b) detection means (9) for detecting particles emitted from the sample.
申请公布号
WO8601335(A1)
申请公布日期
1986.02.27
申请号
WO1985GB00344
申请日期
1985.08.02
申请人
THE UNIVERSITY OF MANCHESTER INSTITUTE OF SCIENCE
发明人
ECCLES, ADRIAN, JOHN;BROWN, ALAN;VICKERMAN, JOHN, CHARLES;VAN DEN BERG, JAKOB, ALBERT