发明名称 DESIGN OF SALICIDE NMOS TRANSISTOR HAVING SHALLOW JUNCTION AND REDUCED ELECTROSTATIC DISCHARGE SENSITIVITY
摘要 PROBLEM TO BE SOLVED: To optimize transistor characteristics by employing established values of M parameter,βparameter and Rsub parameter thereby improving electrostatic/electric overstress performance. SOLUTION: An essential factor having effect on the behavior of an NMOS transistor is theβof a lateral NPN transistor and the amount thereof functions as an index of soundness of high current with respect to a lateral NPN transistor having a given Rsub . Critical level ofβis 5 and a second breakdown trigger current I12 decreases abruptly as theβdecreases below 5. The I12 also decreases as the Rsub decreases. A mechanism for determining the I12 is Joule's heat at the junction of a reverse biased drain substrate. When theβor Rsub is decreased due to increase of M, Joule's heat is increased and the I12 is decreased. Consequently, electrostatic discharge performance is lowered through shallow junction and thick salicide.
申请公布号 JPH10163479(A) 申请公布日期 1998.06.19
申请号 JP19970323583 申请日期 1997.11.25
申请人 TEXAS INSTR INC <TI> 发明人 AMERASEKERA E AJITH;MCNEIL VINCENT M;RODDER MARK S
分类号 H01L29/78;H01L27/02;H01L29/08;H01L29/45;H01L29/739;(IPC1-7):H01L29/78 主分类号 H01L29/78
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