发明名称 X RAY INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To clearly display the corresponding relationship between a real space and an X-ray display image by providing a plate type X-ray surface sensor to detect the two-dimensional distribution of X-ray intensity and a plate type image display to display a two-dimensional X-ray intensity distribution image in response to the direction and the size of the two-dimensional X-ray intensity distribution image in the real space. SOLUTION: An X-ray tube 11 and an X-ray photographing device are installed on both ends of a C-shaped arm 15, and the C-shaped arm 15 is held by a base 16 so as to freely move along its circular arc. A plate type X ray surface sensor 12 is used as the X-ray photographing device, and a plate type image display 13 is installed on this through a hinge 14. In this plate type image display 13, its image is displayed in the direction and the size coincident with a transmitted X-ray image incident on the plate type X-ray surface sensor 12. When the display 13 is overlapped with the X-ray surface sensor 12, since an X-ray image incident just like on the X-ray surface sensor 12 is displayed as a visible image as it is, the positional relationship in a real space can be seized from this display image.</p>
申请公布号 JPH10337286(A) 申请公布日期 1998.12.22
申请号 JP19970166601 申请日期 1997.06.09
申请人 SHIMADZU CORP 发明人 OIKAWA SHIRO;YAMADA TOSHIYUKI;TAKEMOTO TAKAYUKI
分类号 G01N23/04;A61B6/00;G01T1/24;G01V5/00;(IPC1-7):A61B6/00 主分类号 G01N23/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利