发明名称 METHOD AND APPARATUS FOR MEASURING EMISSIVITY OF FINE SINGLE WIRE
摘要 PROBLEM TO BE SOLVED: To obtain a method and apparatus for measuring the emissivity of a fine single wire, capable of conveniently measuring the emissivity of a very fine single wire itself. SOLUTION: Two uniform volume heating hot wires 1, 2 are arranged mutually parallel, while a sample thin wire 3 is connected therebetween. The two hot wires 1, 2 are directly energized and heated so that the heat quantity added to the sample thin wire 3 from one hot wire 1 is equal to that added to the sample thin wire 3 from the other hot wire 2. All the heat added to the sample thin wire 3 is radiated therefrom. The emissivity of the sample thin wire 3 is determined by comparing a theoretical solution for steady thermal conduction concerning volume mean temperature of the 2 hot wires 1, 2, with a steady state value for a volume mean temperature rise thereof provided by measurement.
申请公布号 JP2000356612(A) 申请公布日期 2000.12.26
申请号 JP19990166133 申请日期 1999.06.14
申请人 JAPAN SCIENCE & TECHNOLOGY CORP 发明人 FUJII MOTOO;CHO KO;FUJIWARA MASAYUKI
分类号 G01N25/18;G01J5/00;(IPC1-7):G01N25/18 主分类号 G01N25/18
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