发明名称 DETECTION AND CORRECTION OF DEFECTS FROM SCANNER CALIBRATION REFERENCES
摘要 <p>Computation of digital gains and offsets used in digital scanners for shading correction (linearity correction) is particularly vulnerable to imperfections in the reference strips, particularly the light reference strip. It is extremely difficult and expensive to create references (133, 203) which are completely free of imperfections or contaminated in some way. This invention eliminates artifacts caused by the presence of small imperfections on the references. It does so by detecting the presence of an artifact (133, 134) and then excluding data contributed by the artifact from the calibration computation process.</p>
申请公布号 WO2001088512(A1) 申请公布日期 2001.11.22
申请号 US2001015785 申请日期 2001.05.16
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