发明名称 Contact probe
摘要 A contact probe is fabricated by forming a resin mold with a cavity on a substrate having conductivity, and filling the cavity with metal through electroforming. The metal includes a cobalt-tungsten alloy. Alternatively, a cobalt-molybdenum alloy may be used instead of the cobalt-tungsten alloy. Alternatively, a contact probe can be made from nickel, cobalt or copper, and have a coat film of cobalt-tungsten alloy or cobalt-molybdenum alloy formed thereon to increase the abrasion resistance. A nickel-molybdenum alloy can be used instead of the cobalt-tungsten alloy or cobalt-molybdenum alloy.
申请公布号 US7190179(B2) 申请公布日期 2007.03.13
申请号 US20030472571 申请日期 2003.09.24
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 HAGA TSUYOSHI;OKADA KAZUNORI
分类号 G01R31/02;C22C19/00;C22C19/03;C22C19/07;C25D1/10;G01R1/067;G01R1/073;H05K3/20 主分类号 G01R31/02
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