发明名称 METHOD OF FABRICATING A SEMICONDUCTOR DEVICE HAVING FINE CONTACT HOLE
摘要 A method of fabricating a semiconductor device having fine contact holes is provided to obtain openings of a mask pattern, each having uniform size and secure uniform resistance of contact plugs filling contact holes, by forming first and second molding patterns by patterning first and second molding lines. A method of fabricating a semiconductor device having fine contact holes comprises the steps of: forming an isolation layer(121) defining active regions(118a) on a semiconductor substrate(100); forming an interlayer insulating layer(139) on the semiconductor substrate having the isolation layer; forming a plurality of first molding lines(148) on the interlayer insulating layer; forming a plurality of second molding lines(154) which are located between the first molding lines and spaced away from the first molding lines; patterning the first and second molding lines to form first and second molding patterns; forming a mask pattern surrounding sidewalls of the first and second molding patterns; removing the first and second molding patterns to form openings; and etching the interlayer insulating layer using the mask pattern as an etching mask to form contact holes.
申请公布号 KR20080036498(A) 申请公布日期 2008.04.28
申请号 KR20070032826 申请日期 2007.04.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON, SUNG HYUN;SIM, JAE HWANG;KWAK, DONG HWA;KIM, JOO YOUNG
分类号 H01L21/28 主分类号 H01L21/28
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