| 摘要 |
PROBLEM TO BE SOLVED: To provide a fluorescent X-ray analysis method which enhances the detection sensitivity of a metal element contained in resin, by removing a matrix contained in a resin and by concentrating the element of a measuring target. SOLUTION: A resin sample is ashed by a method for adding an oxidizing agent to the resin sample to heat the resin sample, and fluorescence X-ray analysis of the ashed sample is performed. Alternatively, the resin sample is dissolved in an acid, such as sulfuric acid, and the solution in which the resin sample is dissolved is evaporated to perform the fluorescence X-ray analysis of the residue left, after the evaporation. X rays are scattered not only to reduce C, H, and the like that constitute the matrix of the resin sample that becomes a cause for the background in the fluorescence X-ray analysis and Cl, Br, and the like, absorbing X rays to attenuate the fluorescent X rays from the sample but also to relatively increase the intensity of fluorescent X rays caused by the metal element, as compared with the background to improve the detection sensitivity of the metal element contained in the resin sample. COPYRIGHT: (C)2008,JPO&INPIT
|
