发明名称 PROBE CARD AND METHOD THEREOF
摘要 An MEMS(Micro Electro Mechanical System) probe card of bridge type and manufacturing method thereof are provided to reduce a manufacturing cost by simplifying a manufacturing process of a probe card. A method of an MEMS probe card of a bridge type comprises the following steps: a step for successively evaporating a Si3N4(14), a Au(16), and a PR(Photo Resist, 18) on a silicon substrate(12); and a step for making the silicone substrate etching and/or depositing in a location corresponding to a plurality of masks. A probe is supported with a bridge type in a cavity of the silicone substrate by etching and/or depositing.
申请公布号 KR20080111654(A) 申请公布日期 2008.12.24
申请号 KR20070059870 申请日期 2007.06.19
申请人 NANO DEVICE & DISPLAY TECHNOLOGY CO., LTD.;LEE, JAE HONG;SHINWOO SEMICON CO., LTD. 发明人 LEE, JAE HONG;LEE, KEUN WOO
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
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