TEMPERATURE MEASUREMENT APPARATUS AND METHOD

摘要

A temperature measurement apparatus includes a light source; a first splitter that splits a light beam into a measurement beam and a reference beam; a reference beam reflector that reflects the reference beam; an optical path length adjustor; a second splitter that splits the reflected reference beam into a first reflected reference beam and a second reflected reference beam; a first photodetector that measures an interference between the first reflected reference beam and a reflected measurement beam obtained by the measurement beam reflected from a target object; a second photodetector that measures an intensity of the second reflected reference beam; and a temperature calculation unit. The temperature calculation unit calculates a location of the interference by subtracting an output signal of the second photodetector from an output signal of the first photodetector, and calculates a temperature of the target object from the calculated location of the interference.

主权项

1. A temperature measurement apparatus, comprising:
a light source; a splitter that splits a light beam emanated from the light source into a measurement beam and a reference beam; a reference beam reflector that reflects the reference beam; an optical path length adjustor that adjusts an optical path length of the reference beam reflected from the reference beam reflector; a photodetector that measures an interference between the reflected reference beam and a reflected measurement beam obtained by the measurement beam reflected from a target object; a shutter unit that selectively blocks incidence of the reflected measurement beam onto the photodetector; and a temperature calculation unit that stores as a reference signal an intensity change of the reflected reference beam when the reflected measurement beam is not incident onto the photodetector by closing the shutter unit, calculates a location of the interference from a signal obtained by subtracting the reference signal from an output signal of the photodetector when the reflected measurement beam is incident onto the photodetector, and calculates a temperature of the target object from the calculated location of the interference.