发明名称 |
Memory cells with p-type diffusion read-only port |
摘要 |
A memory cell includes a bistable element and two p-channel transistors (i.e., first and second p-channel transistors). The bistable element includes a plurality of inverting circuits and at least one data storage node. The bistable element may be formed in a first region on the substrate that is partially formed by a p-type diffusion region and an n-type diffusion region. The first and second p-channel transistors are coupled serially. The first p-channel transistor may also have its gate terminal coupled to the at least one data storage node of the bistable element. A method of manufacturing the memory cell includes forming a bistable element having at least first and second data storage nodes, forming a write-only port of the memory cell over an n-type diffusion region and forming a read-only port of the memory cell over a p-type diffusion region. |
申请公布号 |
US9401200(B1) |
申请公布日期 |
2016.07.26 |
申请号 |
US201414579860 |
申请日期 |
2014.12.22 |
申请人 |
Altera Corporation |
发明人 |
Chan Mark T.;Sinha Shankar Prasad |
分类号 |
G11C11/00;G11C11/419;H01L27/11;G11C11/40 |
主分类号 |
G11C11/00 |
代理机构 |
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代理人 |
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主权项 |
1. A memory cell, comprising:
a bistable element that includes a plurality of inverting circuits and that includes at least one data storage node, wherein the plurality of inverting circuits includes pull-up transistors; and first and second p-channel transistors that are coupled in series, wherein the first p-channel transistor has a gate terminal that is coupled to the at least one data storage node of the bistable element, wherein the first and second p-channel transistors have a first threshold voltage, and wherein the pull-up transistors of the bistable element have a second threshold voltage that is different than the first threshold voltage. |
地址 |
San Jose CA US |