发明名称 Method for fabricating a trench capacitor
摘要 A memory cell includes: a trench capacitor, including a trench silicon layer having an upper portion and a lower portion, and a buried plate disposed adjacent the lower portion of the trench silicon layer; an array FET having a gate portion, a drain portion, a source portion, and a buried strap coupled to one of the source and drain portions, the buried strap being in communication with the upper portion of the trench silicon layer; and a collar disposed about the upper portion of the trench silicon layer and between the buried strap and the buried plate, the collar including a re-entrant bend that is operable to decrease an electric field between the buried strap and the buried plate.
申请公布号 US6759292(B2) 申请公布日期 2004.07.06
申请号 US20020283483 申请日期 2002.10.30
申请人 INFINEON TECHNOLOGIES AG;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 SEITZ MIHEL;CHUDZIK MICHAEL P.;MANDELMAN JACK A.
分类号 H01L27/108;H01L21/329;H01L21/8242;H01L29/94;(IPC1-7):H01L21/824;H01L21/20 主分类号 H01L27/108
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