| 摘要 |
An arrangement containing a light source, a shutter (22) and a lens arrangement (24) is used to illuminate a fluorescent material to be studied, employing radiation of the fluorescence excitation wavelength of the material, the exposure being sufficient to bleach the material. The fluorescent emission resulting therefrom is measured by detector means (28, 30) which deliver an electrical signal which is proportional to the instantaneous intensity of the fluorescent emission. The time interval during which the fluorescent emission decays from the initial intensity to a defined fraction thereof is measured and said signal is integrated over the time interval. This method produces the greatest possible fluorescence signal, which makes it possible to study very small particles or those having a low quantum yield of the exciting radiation. <IMAGE>
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