发明名称 TEST SYSTEM FOR TIME DIVISION MULTIPLEXER
摘要 PURPOSE:To attain easily the setting of a reflected path by allowing a control section to receive a reflected path setting indication from an exchange and executing the indication. CONSTITUTION:A prescribed reflected path setting indication is transmitted to the control section SCU of a time division multiplexer TDM from an exchange EX. The control section SCU receives the reflected path designation indication and sets the reflected path to a specified position of an input/output section of the device TDM and a modulator-demodulator section HMU to execute the reflected test. Thus, the reflected path is set without requiring much man-hour.
申请公布号 JPS59231939(A) 申请公布日期 1984.12.26
申请号 JP19830107140 申请日期 1983.06.15
申请人 FUJITSU KK 发明人 YUNOKI HIDEO
分类号 G01R31/00;H04B3/46;H04J3/14;H04M3/26;(IPC1-7):H04J3/14 主分类号 G01R31/00
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