| 摘要 |
PURPOSE:To enable the automatic selection of an optimum slit program, by shifting a slit program in linkage to the setting of a wave scanning speed so that a relatively wide slit width can be realized. CONSTITUTION:In a double-beam spectrophotometer comprising a light source L, a collation cell Cr, a sample sell Cs, a beam mixer 5, spectroscope 6, a detector 10, etc., a control computer 8 computes the ratio between an integrated output Is of a sample signal and an integrated output Ir of a collation signal when the integrated output Ir of the collation signal exceeds a prescribed level. This ratio indicates the transmittance of a sample representing the integrated section thereof. When a collated light signal obtained by using a reference slit program is denoted by Pr, a wave scanning speed by V and a slit opening rate selected at said scanning speed by B, on the occasion, an optimum slit program is selected automatically according to the scanning speed by varying the opening rate B in proportion to a square root of the wave scanning speed V by means of a keyboard 16. |
