发明名称 |
Test probe assembly for testing integrated circuit devices |
摘要 |
A test probe assembly for testing an integrated circuit (IC) device having contact pads deployed in a predetermined pattern in a common plane. The assembly includes a contactor formed by a flexible film of dielectric material having a rectangular planar central zone from whose corners extend radial slots to define suspension quadrants. Probe contacts formed on the undersurface of the central zone in a matching pattern are connected to probe terminals on the margins of the quadrants. The quadrants are marginally supported on corresponding branches of a mounting frame whereby the central zone sags below the frame which surrounds a central port in a printed circuit board, the port exposing the central zone to the IC device to be tested.
|
申请公布号 |
US4975638(A) |
申请公布日期 |
1990.12.04 |
申请号 |
US19890452050 |
申请日期 |
1989.12.18 |
申请人 |
WENTWORTH LABORATORIES |
发明人 |
EVANS, ARTHUR;BAKER, JOSEPH R.;RISING, ROBERT P. |
分类号 |
G01R1/073 |
主分类号 |
G01R1/073 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|