发明名称 Apparatus and method for mapping inhomogeneities on the surface of bulk and thin film superconductors
摘要 Apparatus and methodology for mapping the superconductive properties of a sample of superconducting material. The material is cooled so that it is a mixed state and an alternating magnetic field is induced in a portion of the sample to be tested. The harmonic component of the induced alternating magnetic response is measured at a location proximate to the point of induction. As the inducing and measuring devices are displaced relative to the sample the measured amplitude of the harmonic component is stored in suitable storage means as a function of location in the sample. Thus, a map of the superconducting properties of the sample may be generated.
申请公布号 US5030912(A) 申请公布日期 1991.07.09
申请号 US19890455719 申请日期 1989.12.21
申请人 NORTH AMERICAN PHILIPS CORP. 发明人 HERKO, SAMUEL P.;BHARGAVA, RAMESHWAR N.;SHAULOV, AVNER A.
分类号 G01R33/12 主分类号 G01R33/12
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