发明名称 |
METHOD FOR FORMING AN OXIDE FILM WITH NON-UNIFORM THICKNESS AT A SILICON SUBSTRATE SURFACE |
摘要 |
The invention concerns a method comprising steps which consist in: a) implanting in predetermined zones of the substrate an efficient dose of atoms of a species accelerating the substrate oxidation kinetics; and b) growing by oxidation a silicon oxide film with non-uniform thickness on the substrate surface. The invention is useful for producing oxide films for MOS transistor grids.
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申请公布号 |
WO0006489(A1) |
申请公布日期 |
2000.02.10 |
申请号 |
WO1999FR01756 |
申请日期 |
1999.07.19 |
申请人 |
FRANCE TELECOM;HALIMAOUI, AOMAR;GROUILLET, ANDRE |
发明人 |
HALIMAOUI, AOMAR;GROUILLET, ANDRE |
分类号 |
C23C8/02;C23C14/48;C23C14/58;H01L21/283;H01L21/316;H01L21/8234;H01L27/088;(IPC1-7):C01B33/113 |
主分类号 |
C23C8/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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